Sensitive compositional analysis at the micro- and nanoscale, a secondary ion mass spectroscopy workshop

Watch this webinar to gain insight into SIMS technology and discover an innovative solution offering the current world record in SIMS lateral resolution

16 Apr 2020
Cameron Smith-Craig
Cameron Smith-Craig
Pharma and Applied Sciences Editor
Zeiss
Dr. Fabián Pérez Willard, Carl Zeiss Microscopy GmbH, and Douglas Runt, Carl Zeiss SMT, Inc.

When it comes to elemental analysis of low concentrations or light elements, secondary ion mass spectroscopy (SIMS) is the technique of choice for materials characterization. SIMS not only allows the detection of element traces down to the parts per million (ppm) level, it also enables the detection of all elements of the periodic table, isotopes, and small ion clusters.

In this popular workshop, gain insight into SIMS and discover the new ZEISS SIMS portfolio, including cost-efficient add-ons for ZEISS FIB-SEMs as well as an innovative solution offering the current world record in SIMS lateral resolution. Selected applications in steel failure, battery, and solar cell research illustrate the use of the different ZEISS SIMS solutions.

Register Now

Join this webinar to learn about:

  • The basics of SIMS, including a brief overview of different mass selection principles
  • How a cost-efficient SIMS add-on performs on a standard FIB-SEM instrument
  • How to achieve the highest spatial resolution with SIMS using the neon ion beam of a helium ion microscope (HIM)

Attend the live webinar on Tuesday, May 5, at:
16:00 BST | 11:00 EDT | 08:00 PDT | 17:00 CEST

Who should attend?
Microscopists interested in analytical techniques complementary to EDS.

All webinar participants can request a certificate of attendance and a learning outcomes summary document for continuing education purposes.

Find out more on this topic by registering to watch the full webinar>>

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ZEISS LSM 780 Laser Scanning Microscope

ZEISS Research Microscopy Solutions

LSM 780 - Obtain Quantitative Information About Your Cells and Individual Molecules. The sensitivity of LSM 780 is quite simply outstanding. The GaAsP detector achieves 45 percent quantum efficiency compared to 25 percent typically by conventional PMT detectors. This results in accurate details and contrast-rich images of the challenging specimens you encounter in your live cell imaging.The system’s illumination and detection design allows you to simultaneously acquire up to ten dyes. You excite any common fluorophore with up to eight different lasers, detecting the signals with the 32 channel GaAsP detector. LSM 780 is so sensitive, the system even allows photon counting.The maximum possible acquisition speed available to you is determined by the sensitivity of your detection system. When you choose LSM 780, you benefit from new GaAsP detectors that bring a significant improvement on signal-to-noise ratio, allowing you to acquire your image sequences at least twice as fast.Parallel spectral detection also reads 34 channels simultaneously in Lambda mode: you acquire and separate up to ten colors simultaneously.LSM 780 allows you to achieve images of unparalleled detail, even from the most challenging specimens. The superior quality and sensitivity has been recognized by a distinguished R&D 100 Award in 2011.LSM 780 Laser Scanning Microscope Features: 32-channel GaAsP detector with a typical quantum efficiency of 45% – a significant improvement on the 25% typically achieved by classic PMT detectors. Potential for photon counting on GaAsP and the new side PMT. With lasers from 355 nm true UV to 660 nm far red, any dye will be excited optimally. Simple adaptation to changing acquisition strategies via the ZEN software’s Smart Setup. Improved ZEN software with modules for e.g. correlative microscopy, deconvolution and time lapse. Improved dynamics for better visualization of weak signals. Active cooling together with oversampling and photon counting modes deliver improved signal-to-noise ratio.

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