Thermo Fisher Scientific Launches MagnaRay Spectrometer Creating the First Completely Integrated EDS/WDS System

3 Aug 2008
Greg Smith
Analyst / Analytical Chemist

Product news

Thermo Fisher Scientific Inc., the world leader in serving science, today announced the launch of the first intelligent Wavelength Dispersive X-ray spectrometer (WDS), the Thermo Scientific MagnaRay™ WDS Spectrometer. The instrument automatically combines energy dispersive spectroscopy (EDS) results with WDS operations using the embedded expert system. Integrated with the Thermo Scientific EDS NORAN System 7, the MagnaRay determines the elements to be analyzed simultaneous to the EDS collecting the data, providing unparalleled microanalysis results with confidence and accuracy. The MagnaRay WDS Spectrometer will be showcased at the Thermo Scientific booth #834 at the Microscopy & Microanalysis 2008 conference, August 3-7 in Albuquerque.

Building on the ten year history of Thermo Fisher Scientific’s MAXray WDS spectrometer, the new MagnaRay combines the benefits of EDS and WDS to help identify elements in a sample as well as their quantitative value. Seamless integration with the NORAN System 7 software means that EDS operators are already trained for WDS analyses. The benefits associated with NORAN System 7 are enhanced when combined with the MagnaRay spectrometer, offering exceptional EDS/WDS qualitative, quantitative and x-ray imaging capabilities.

The innovative design makes nanoanalysis a possibility for the first time, easily operating at lower voltages than traditional WDS. “Intensities of low energy x-rays can be 10 to 100 times higher than traditional WDS technologies enabling the MagnaRay to provide unmatched levels of application performance thanks to low-voltage and low beam current operating conditions,” explains David Rohde, microanalysis manager, Thermo Fisher Scientific. “The design of the spectrometer widens the application base allowing it to be easily used on SEM and FESEM.”

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.