Edax Launches Latest Generation of Micro X-Ray Fluorescence Spectrometer

19 Mar 2009
Samantha Rosoman
Campaign Coordinator

Product news

EDAX Inc., a leader in micro X-ray fluorescence, has introduced the Orbis micro-XRF elemental analyzer system, setting a new standard in analytical flexibility. Building on more than 10 years of micro-XRF experience, the Orbis spectrometer incorporates a unique motorized turret that integrates video and X-ray optics allowing coaxial sample view and X-ray analysis.

Two additional X-ray collimators can be added to the optical turret for a total of three X-ray beam sizes to expand Orbis’ analytical capabilities beyond traditional micro-XRF analysis. The working distance also is increased to allow analysis over rough sample topography without sacrificing signal intensity.

Primary beam filters can be used with a variety of X-ray optics to allow true XRF analytical capabilities in a micro-spot analysis. The Orbis system is available with mono-capillary optics or as the Orbis PC with an ultra high-intensity poly-capillary optic.

Detection limits with the Orbis PC can be < 5 PPM for a spot size of 30 to 40 μm using primary beam filters. The Orbis is also available with a large area LN-Free SDD for the ultimate in signal throughput while maintaining excellent elemental peak resolution further improving detection limits.

All this analytical flexibility is packaged into a table-top unit with powerful, easy-to-use analysis software. Orbis users can make elemental analyses on small samples such as particles, fragments and inclusions, or conduct automated multi-point and elemental imaging analysis on larger samples with all the benefits and simplicity of an XRF analyzer.
Among the benefits of the Orbis system are non-destructive measurement, minimal sample preparation (e.g. no sample coating is necessary), improved sensitivity for many elements in comparison to SEM/EDS, inclusion and coating thickness analysis with the penetrating power of X-rays, and analysis of wet samples.

Applications for the Orbis micro-XRF system span a gamut of end uses and include criminal forensics, industrial forensics and quality control, non-destructive materials testing, RoHS compliance, layer thickness and composition analysis, geologic composition and more.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron BackScatter Diffraction and X-ray Fluorescence instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.