Application Note: Determination of silicon and other trace elements in light naphtha feedstocks by HR ICP-OES
5 January 2023

In this application note, Analytik Jena presents the application advantages for trace element determination in light naphtha samples originating from an ICP-OES instrument with high-resolution (HR) optics (2 pm @ 200 nm), intelligent torch design, superior sensitivity, and high plasma robustness.