Application Note: Comparison of Methods: Dynamic Image Analysis, Laser Diffraction and Sieve Analysis
4 September 2015

This white paper provides an overview of the informative value and significance of particle analysis results and how to decide which method is best suited for a particular application. The most common methods to determine the particle size are dynamic image analysis (DIA), static laser light scattering (SLS, also called laser diffraction) and sieve analysis. This article presents the advantages and drawbacks of each technique, their comparability among each other as well as detailed application examples. Each method covers a characteristic size range within which measurement is possible, and which partly overlap. The three methods presented here, for example, all measure particles in a range from 1 μm to 3 mm. However, the results for measuring the same sample can vary considerably.