Application Note: In Situ & 4D Science: Observing and Quantifying the Evolution of 3D Microstructure
17 December 2014

A new materials science has emerged in which samples are analyzed “in situ” to facilitate essential characterization of performance under relevant operating or environmental conditions. This technical note demonstrates how the ZEISS 3D X-ray microscopes (XRM) are uniquely suited to image materials in situ under variable environments in 4D (3D plus time) in order to non-destructively characterize and quantify the evolution of 3D microstructures.