Reviews
"The instrument is very well made. No significant problems after 5 years of usage. Just normal maintenance. After sales service is very helpful and re..."
Giorgio Nasillo
‘Membership Status’ indicates whether this member is an active reviewer on the site, and how many reviews have been published.| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
To be seen as an authority on SelectScience, find your products to review today., UNIVERSITY OF PALERMO
"Can use XRF in lab or in field because it is portable. Very easy to obtain results from liquid or solid samples. POrtable XRF is very convenient for ..."
Lindsey Jacobs
‘Membership Status’ indicates whether this member is an active reviewer on the site, and how many reviews have been published.| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
To be seen as an authority on SelectScience, find your products to review today., Missouri Western State University
"I have found that Bruker's handheld XRF is very easy to use and simple to understand, almost intuitive. The spectra is usually very good and easy to ..."
Madeline Corona
‘Membership Status’ indicates whether this member is an active reviewer on the site, and how many reviews have been published.| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer![]() | 1-4 |
Advanced Reviewer![]() | 5-14 |
Expert Reviewer![]() ![]() | 15+ |
To be seen as an authority on SelectScience, find your products to review today., Trinity University
Latest news
News
Bruker Launches the METALJET Microfocus X-ray Source for Structural Biology Applications
19 Nov 2012
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An Innovative, Compact Small Angle X-ray Scattering System for Advanced Materials Research
19 Nov 2012
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Handheld XRF for Geological Analysis and Research
27 Sep 2011
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Bruker AXS Microanalysis Introduces Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash® Silicon Drift Detectors and New Particle Analysis Software
04 Aug 2008
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Bruker AXS Microanalysis Introduces New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series at M&M 2008
04 Aug 2008







