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ANPx101/NUM Positioner  
Attocube Sytems, AG

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Attocube Systems ANPx101/NUM Positioner The ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can...
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ANPx101/RES Positioner  
Attocube Sytems, AG

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Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be...
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ASC500  
Attocube Sytems, AG

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Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with...
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attoFPSensor  
Attocube Sytems, AG

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Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single...
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DNA Test Sample  
K-TEK Nanotechnology

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K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica.
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HOPG: GRAS/1.2  
K-TEK Nanotechnology

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K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects -...
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HOPG: GRAS/1.5  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/1.2  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/1.7  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of...
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HOPG: GRBS/2.0  
K-TEK Nanotechnology

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HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degrees Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic...
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STEPP Calibration Sample  
K-TEK Nanotechnology

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STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic...
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TGS1 Calibration Grating Set  
K-TEK Nanotechnology

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K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity...
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TGS2 Calibration Grating Set  
K-TEK Nanotechnology

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Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration ...
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TGSFull Calibration Grating Full Set  
K-TEK Nanotechnology

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Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM...
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Digital Pulsed Force Mode  
WITec GmbH

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Pulsed Force Mode (PFM) is a non-resonant, intermediate contact mode for Atomic Force Microscopy that allows the characterization of material properties such as adhesion and local...
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