ZEISS Crossbeam Family

Explore new insights from an industry-wide survey and discover answers to questions such as:

• What are the key research sectors, applications, and materials being investigated?
• What experimental outcomes are scientists looking for?
• How is constantly developing technology landscape impacting scientists?

Plus, delve into the key challenges in biomaterial analysis and the solutions that can drive your workflows forward, including automation, AI, and beyond.

Materials science is crucial in shaping our world and driving innovation across various fields like aerospace, construction, and medicine. It involves understanding the behavior of materials such as alloys, ceramics, composites, and polymers throughout their lifecycle. This knowledge is essential for optimizing their properties for specific applications.

Download this expert guide for free today and explore advanced microscopy solutions from ZEISS, including 3D non-destructive high-resolution X-ray microscopes and scanning electron microscopes (SEM). The eBook also covers analytical techniques such as Electron Channelling Contrast Imaging (ECCI) and Electron Backscattered Diffraction (EBSD).

Plus, find case studies on polycrystalline materials, metals, alloys, fiber composites, and multiscale samples, and learn about the tools essential for modern materials science analysis.

Nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were fabricated and characterized using FIB-SEM. Direct FIB nanopatterning of silicon master stamps allows fast prototyping of nanochannels of different shapes, cross sections and depths.

In this application note, ZEISS demonstrates how the Crossbeam can be an extremely useful tool for research in the field of nanofluidics and single molecule detection.

State-of-the-art preparation methods are mechanical polishing with a vibration-polish finish for large areas or focused ion beam (FIB) polishing for smaller areas and sensitive materials.

In this application note, ZEISS demonstrate how to overcome the limitations of these methods by utilizing the new femtosecond laser for ZEISS Crossbeam, to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.

In this application note by ZEISS, a range of chemical analysis methods was applied to identical individual Li (Ni0,33Mn0,33Co0,33)02 cathode particles. The chemical studies revealed different insights and were compared side by side.

Coatings have a broad range of applications in industries like pharmaceuticals, automotive, medical devices, textiles, oil and gas, aerospace and defense, food and packaging, and consumer optics, thanks to their role as functional, high- performance or protective materials. This paper illustrates a case study on how optical and confocal microscopy, focused ion beam (FIB), and correlative microscopy are used by ZEISS R&D to make sure new customer demands are met while keeping the quality and great performance of coatings.

For more than 13 years ZEISS has been known as a manufacturer of two-beam FIB-SEM systems – Crossbeam instruments. During these years, Crossbeam performance in terms of image resolution and contrast, ease of use, workflow automation and throughput has improved continuously. This development culminates in today’s ZEISS Crossbeam 550.

ZEISS Microscopy offers multi-modal characterizations and advanced analysis options for industry and research. This application note provides a variety of applications of ZEISS products to analyze steel and other metals.

Efficiency of thin-film copper indium gallium selenide (CIGS) solar cells is above 22 percent reaching the performance levels of modern polycrystalline silicon solar cells. Strong development efforts are ongoing to further increase cell efficiency. In this context, electron microscopy plays a crucial role because it allows the analysis of the microstructure of the solar cell through all relevant length scales and with very high resolution.

In this application note, high-efficiency thin-film solar cells based on Cu(In,Ga)Se2 were studied extensively by focused ion beam – scanning electron microscopy (FIB-SEM) on a ZEISS Crossbeam. Cross sections of cells on different substrates were prepared by FIB to reveal the internal structure of the cell, allowing detailed characterization of the electrodes and microstructure throughout the cell by STEM, EDS and SIMS.

In this application note, high-resolution SEM imaging is executed on non-conductive samples by the integration of a charge compensation system.

April 29, 2025 - 09:00 BST / 10:00 CEST / 16:00 CST / 17:00 JST

Join us for an informative webinar sponsored by ZEISS, where we will introduce ZEN core, a sophisticated software solution designed to enhance your microscopy workflows. This session will focus on how ZEN core provides a streamlined user interface that accommodates both light and electron microscopy, allowing users to transition seamlessly between modalities.

During the session, you will discover how ZEN core's intuitive user interface adapts to the unique needs of your laboratory allowing users of all experience levels to efficiently image, analyze, and manage data. We will explore the advanced imaging capabilities, automated workflows, and powerful AI features that make ZEN core the command center for both light and electron microscopes.

Join us for a live demonstration of ZEN core and take part in our Q&A session to address your specific inquiries. Register today to learn how ZEN core can support your microscopy research and analysis needs.

Key learning objectives:

• Understand how ZEN core fosters seamless collaboration in connected laboratory environments
• Explore the integration of multiple microscopy techniques within a unified platform
• Learn how ZEN core ensures data consistency and standardization across instruments and locations

Who should attend?

This webinar is ideal for researchers in both academia and industry looking to improve their microscopy practices and enhance productivity.

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

If you view the on-demand webinar, you can request a certificate of attendance by emailing editor@selectscience.net.

In this video, learn how to prepare a TEM sample using the ZEISS Crossbeam.

In this video, learn how ZEISS is developing technologies for use at the cutting edge of science, consumer electronics, energy, construction, and more.

Peter Lander discusses the legacy and development of ZEISS microscopy and the importance of conferences such as M&M. Its collaboration with scientists has enabled ZEISS to provide instrumentation that satisfies their needs, with the aim to develop simplified software that enables complementary and overlaying analyses over a range of its instrumentation.

Dr Rosy Manser, Carl Zeiss Microscopy GmbH, Germany, discusses new X-Ray Microscopy applications enabled by the latest ZEISS technology, including the imaging of unstained tissue using the ZEISS VERSA XRM. Also, learn how the technology can be used as part of a correlative microscopy workflow.

Exclusive interviews, new methods, free downloads and much more to help advance materials characterization research and development

Take a look back through 2019 at the best content from our analytical community

Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography, and greater integration in data reporting

Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography and greater integration in data reporting

Upgrade opens new opportunities in materials science and covers advances in analytics, tomography, sample preparation, and data integrity

Promise of enhanced analytics, tomography, sample preparation and data integrity

Discover a range of cutting-edge applications and new technologies, plus, don't miss our exclusive video interview with a Nobel laureate

We look back at the biggest stories and the best content from our analytical chemistry communities

Creating TEM lamellae with the new Ion-sculptor FIB column of ZEISS Crossbeam