TETRA 16 Non-Contact AFM Probe

TETRA 16 Non-Contact AFM Probe

K-TEK Nanotechnology

TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, pro...read more

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Description

 

TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology

The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability.

Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip coating, the TETRA series provides its users with the quality they seek at a price they can afford.

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