SU3500 Premium VP-SEM

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Hitachi High Technologies America, Inc.

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the...read more

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Description

 

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

Unparalleled Image Quality - All new electron optics design with best-in-class image sharpness
Intuitive Operation - Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology
Ultra Variable-Pressure Detector -Image surface information at low vacuum and low accelerating voltages
Stereoscopic Image Function -Point and click for seamless, real-time "3D" image observation

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