NSG30 AFM Mode Non-Contact Probe



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K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe

This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.

Available Options with the K-TEK NSG30 AFM Non-Contact Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

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