NSG30 AFM Mode Non-Contact Probe

NSG30 AFM Mode Non-Contact Probe
by K-TEK Nanotechnology


K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG30 AFM Non-Cont...read more

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Description

 

K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe

This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.

Available Options with the K-TEK NSG30 AFM Non-Contact Probe:

-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*

*Quantity & cantilever restrictions apply.

Product Overview

NSG30 AFM Mode Non-Contact Probe by K-TEK Nanotechnology
NSG30 AFM Mode Non-Contact Probe

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