JCM-6000 Neoscope™ Scanning Electron Microscope

Manufacturer Nikon Instruments Europe  |  Available Worldwide
  |  2 reviews

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Average Rating: 4.2
2 Scientists have reviewed this product

5 out of 5
Ease of use
4 out of 5
After sales service
4 out of 5
Value for money

Can't do work without this! It is phenomenal
Rating: 4.3

  • Application Area: Scanning electron microscopy

"Very easy to use and excellent SEM images for the price."

Review date: 08 Dec 2015 | JCM-6000 Neoscope™ Scanning Electron Microscope
  • Status:


  • Member since: 2007

  • Organization: USQ

  • Ease of use
    4 out of 5
    After sales service
    4 out of 5
    Value for money
    4 out of 5
Rating: 4.0

  • Application Area:Environmental and agricultural engineering, fibre composites

"We got good results from the instrument and it is easy to use. We would like to upgrade to material analysis but it's too expensive."

Review date: 27 Aug 2015 | JCM-6000 Neoscope™ Scanning Electron Microscope

A powerful yet economic benchtop version from Nikon and JEOL.

As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution anddepth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.

The new JCM-6000 "NeoScope™," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide.



High performance system in a compact, innovative model

  • Well focused 3D morphological observation
  • Backscattered electron imaging for compositional distribution
  • Metrology supported
  • Imaging of tilted, rotated samples (Optional)

Compact, light, and energy saving

  • Compact body equal to an optical microscope
  • Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
  • Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

New capabilities for imaging

  • Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from the lowest 10x for wide area of view up to 60,000x

Enhanced low vacuum capability

  • Easy touch panel operation
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
  • Easy, dependable auto gun alignment (filament centering)