Axio Vert.A1 for Materials

Axio Vert.A1 for Materials
by ZEISS Microscopy


Microstructural and Structural Analysis: A Question of Contrast. With Axio Vert.A1 you examine large, heavy samples, using a wide range of classic and advanced contrast methods. Switch easily between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast in reflected light. In transmitted light, use brightfield, polarization and phase contrast. Or combine several contrast...read more

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Description

 

Microstructural and Structural Analysis: A Question of Contrast.

With Axio Vert.A1 you examine large, heavy samples, using a wide range of classic and advanced contrast methods. Switch easily between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast in reflected light. In transmitted light, use brightfield, polarization and phase contrast. Or combine several contrast methods for the maximum amount of information.

The 5x encoded nosepiece turret recognizes a change of objectives automatically. It also enables the use of a light manager to save and recover light intensity values. You quantify your structure efficiently, evaluate the properties and quality of your materials. Gain valuable new understanding and optimize preparation or production processes. And then take appropriate measures.

Product Overview

Axio Vert.A1 for Materials by ZEISS Microscopy
Axio Vert.A1 for Materials

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