AFM and Raman Imaging Combination alpha300 AR
AFM and Raman Imaging Combination alpha300 AR - Linking chemical information with topography structures
The combined AFM / Confocal Raman Imaging system WITec alpha300 AR allows the acquisition of Raman images from chemical investigations to be linked to the AFM topographic information from the same sample area. No transferring or touching of the sample is required as the two modes are easily accessible by just rotating the microscope turret. Even simultaneous AFM-Raman data acquisition is possible.
The instrument combines all the features provided by the WITec alpha300 R Confocal Raman Microscope and the alpha300 A Atomic Force Microscope. As the modular concept is also reflected in the WITec software tools, the AFM and Raman Imaging features are accessible by using a single software environment (WITec Control and WITec Project).
For optical images with a resolution that surpasses the diffraction limit, the alpha300 can even be upgraded with the Scanning Near-field Optical Microscopy features. It then combines Confocal/Raman Microscopy, AFM and SNOM in a single instrument.
Application notes and news
- Imaging of a Diamond Film, Carbon Nanotubes and Graphene with Confocal Raman and Atomic Force Microscopy
- Characterization of the Polymer Blend PMMA-SBR: Combining Confocal Raman and Atomic Force Microscopy
- Raman, PL and AFM Measurements on Laser Lithographically Written Structures in Si
- Confocal Raman and AFM Imaging of Paper