Helios NanoLab™ - DualBeam™

Helios NanoLab™ - DualBeam™
 4.1/5.0 (4 reviews)

FEI Company

The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is design...read more

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Reviews

Stephen Croxall


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Member since 2012

Organization:
UNIVERSITY OF CAMBRIDGE
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RATING: 4.0

  • 5 out of 5EASE OF USE
  • 4 out of 5AFTER SALES SERVICE
  • 3 out of 5VALUE FOR MONEY




Review date: 13 Nov 2012

Application Area: 3D Imaging
Helios NanoLab™ - DualBeam™

"The automation processes involved with this microscope enable fast acquisition of 3D volumes. The alignment processes are very quick to perform and reliable, although some fine tuning is needed for very accurate imaging. The reliability of the machine allows for the microscope to be left running for days without intervention. Above all, the image quality is amazing allowing near nanometer resolution across a few microns, allowing bulk material to be analysed in detail."

Read 4 reviews

Andre Blasig


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Member since 2012

Organization:
TU Causthal
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RATING: 4.6

  • 5 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 04 Jul 2012

Application Area: FESEM Electron Microscopy
Helios NanoLab™ - DualBeam™

"Very good instrument for nano analytics, it's very flexible with a nice cryo chamber. Produces high quality pictures."

April Holland


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Member since 2010

Organization:
UNC-CH
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RATING: 3.7

  • 3 out of 5EASE OF USE
  • 4 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 15 Apr 2010

Helios NanoLab™ - DualBeam™

"A very useful system and prompt service."

Amy Hargis


Status:


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Member since 2010

Organization:
UNC Chapel Hill
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RATING: 4.0

  • 3 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 15 Apr 2010

Helios NanoLab™ - DualBeam™

"An excellent FIB instrument."

Description

 

The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.

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