MiniFlex Benchtop XRD by Rigaku Corporation

Manufacturer Rigaku Corporation
4.7
/
5.0
  |  1 reviews
New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry f... Read more


MiniFlex Benchtop XRD by Rigaku Corporation product image
MiniFlex Benchtop XRD

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Average Rating: 4.7
1 Scientist has reviewed this product

5 out of 5
Ease of use
5 out of 5
After sales service
4 out of 5
Value for money


Excellent benchtop model, a must for crystal studies.
Rating: 4.7

  • Application Area: Surface area analysis and crystal nature

"Ideally suited for quick and detailed analysis, ease of operation and excellent reproducibility."

Review date: 29 Mar 2018 | MiniFlex Benchtop XRD

New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification.

New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
 

Overview:

  • New 6th generation design
  • Compact, fail-safe radiation enclosure
  • Incident beam variable slit
  • Simple installation and user training
  • Factory aligned goniometer system
  • Laptop computer operation

Measurements:

  • Phase identification
  • Phase quantification
  • Percent (%) crystallinity
  • Crystallite size and strain
  • Lattice parameter refinement
  • Rietveld refinement
  • Molecular structure

Options:

  • 8-position autosampler
  • Graphite monochromator
  • D/teX Ultra: silicon strip detector
  • HyPix-400 MF: 2D HPAD detector
  • Air sensitive sample holder
  • Travel case