New Quantitative AFM Viscoelastic Mapping Techniques for Soft Samples
6 Sept 2012Asylum Research announces AM-FM and Loss Tangent Imaging, two new complementary imaging modes for viscoelastic mapping that are available in its NanomechPro™ Toolkit.
These tools enable precision nanomechanical measurements of soft samples using the ease, speed and reliability of tried and true tapping mode to quantify stiffness/elasticity, loss modulus and tip-sample dissipation. Stiffness and sensitivity calibration, and automatic elastic Hertz modeling is integrated in the software. This easy-to-use graphical interface allows flexibility and control of all model parameters along with numerous customization possibilities. AM-FM and Loss Tangent offer many benefits over other techniques including:
• Quantitative results on a wide variety of samples
• High speed with demonstrated 10-20Hz line scan rates even on rough samples
• High resolution with repeatable single atomic point defect stiffness resolution
• Frequency feedback and topographic feedback are decoupled, allowing much more stable, robust operation
• Based on tapping mode, a proven, reliable and non-invasive technique
Demonstrations will be performed on Cypher™, the fastest and highest resolution AFM, in Booth 104 at EMC. To schedule a demo, please visit Asylum Research’s website. There will also be a technical talk on September 18th at 11:45am given by Dr. Mick Phillips. The topic of the talk is "AM-FM and Loss Tangent Imaging - Two New Tools for Quantitative Nanomechanical Properties".
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Cypher™ AFM
Asylum ResearchCypher™ AFM - The World's Highest Resolution AFM Asylum Research introduces the Cypher AFM, the industry’s first completely new small sample AFM/SPM in over a decade. Cypher AFM from Asylum Research - Decode the Nanoworld with the Next Generation of AFM Cypher is the world’s highest resolution AFM. The Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy and control of closed loop with the power of atomic resolution for the most accurate images and measurements possible today. Additional capabilities include SpotOnTM automated laser alignment with a mouse-click, interchangeable light source modules that allow laser spot sizes down to 3um for broad application and scan mode flexibility, and support for high-speed AC imaging with cantilevers smaller than 10um. The Cypher AFM is currently being shown at events worldwide.