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Highest performance AFM-Raman system, now with Bruker's exclusive high-contrast IRIS TERS probes.
Bruker’s Innova-IRIS (Integrated AFM-Raman Ima... Read more...
Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resol... Read more...
QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM
QUANTAX WDS features the compact XSense spectrometer. This ... Read more...
QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis
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Superior integration of confocal imaging and photoactivation for biology applications.
The Opterra Multipoint Scanning Confocal Microscope combi... Read more...
World's Ultimate AFM
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Uncompromised Imaging and Metrology for Widest Range of Surfaces Combining exceptional profiling performance, operator convenience, and affordabi... Read more...
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