Secondary Ion (SIMS)

1 of 1   Page     1 
MAX Probe  

The ultimate answer to your analysis needs. Extrel offers a wide range of flange mounted Quadrupole Mass Spectrometers and Residual Gas Analyzers (RGA)that can fit any application or...
Read more

Variable-energy electron ionisation source technology for GC-MS - Select-eV(r). By enabling the energy of ionising electrons to be changed, Select-eV breaks new ground in the field of...
Read more

PHI nanoTOF TOF-SIMS The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented...
Read more

Looking For General Lab Products?

Click here to go to the General Lab product directory


Introducing the LSM 800 with Airyscan from ZEISS