Filtered by: Supplier: FEI Company (remove this filter)


            SORT BY  1 of 2   Page     1 2     Next
Amira 3D Analysis Software  

Request info

Amira® is a powerful, multifaceted 3D software platform for visualizing, manipulating, and understanding biomedical data coming from all types of sources and modalities. Initially...
Read more
Aspex Explorer  

Request info

The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
Read more
Aspex Express  

Request info

The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
Read more
Aspex Extreme  

Request info

The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
Read more
Avizo® Fire  

Request info

3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
Read more
Certus 3D - Dualbeam  

Request info

The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
Read more
CLM-3D - DualBeam  

Request info

The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
Read more
CorrSight   

Request info

FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
Read more
ExSolve Wafer TEM Prep  

Request info

The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
Read more
Helios NanoLab 1200AT - DualBeam  

Request info

The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
Read more
Helios NanoLab 460F1 - DualBeam  

Request info

The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
Read more
Helios NanoLab 460HP - DualBeam  

Request info

The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
Read more
Helios NanoLab™ - DualBeam™   

4 out of 5

Request info

The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

4 review(s) of this product / read all

Helios NanoLab™ 660 - DualBeam  

Request info

The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
Read more
Inspect™ - Scanning Electron Microscope   

4 out of 5

Request info

With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
Read more
  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Magellan XHR Scanning Electron Microscope  

5 out of 5

Request info

Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Metrios - Transmission Electron Microscope  

Request info

The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. ...
Read more
MLA  

Request info

he MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials,...
Read more
NovaNano - Scanning Electron Microscope  

Request info

The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline...
Read more
QEMSCAN - Scanning Electron Microscope  

Request info

QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data,...
Read more
Quanta™ - Scanning Electron Microscope   

5 out of 5

Request info

The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

16 review(s) of this product / read all

Scios - DualBeam™  

Request info

FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With...
Read more
Talos - Transmission Electron Microscope  

Request info

Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences...
Read more
Tecnai - Transmission Electron Microscope   

4 out of 5

Request info

The FEI Tecnai™  transmission electron microscopes are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
Read more
  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / read all

Tecnai Arctica - Transmission Electron Microscope  

Request info

The Tecnai Arctica is a powerful, automated high resolution electron microscope for 3D characterization of biological samples. Its revolutionary cryo-based technology easily integrates...
Read more

 SHOW   25 | 50 items/page

1 of 2   Page     1 2     Next


 
Looking For General Lab Products?

Click here to go to the General Lab product directory

PCR Buying Guide Banner

Buying guides

Advertisement

Analyzing Footballers with Mass Sp...

Play this video

Advertisement

Advertisement

Write a Review