The conference, now in its fourth year, provides an optimum forum for scientists to share information on a wide variety of cutting-edge nanotechnology topics. Paul Hansma from the University of California, Santa Barbara will be this year's keynote speaker. Abstracts for papers and posters presentations are now being accepted. Abstract conference registration details are available at http://www.veeco.com/nanoconference
The theme of the three-day symposium is "Exploring Nanostructure Imaging, Characterization and Modification using Scanning Probe Microscopy and Related Techniques." Several hundred international researchers and scientists have attended the prior years' events.
Don Kania, Ph.D., Veeco's President and Chief Operating Officer, commented, "In our fourth year, we are moving the conference to University of Pennsylvania, a key center of nano-research. We expect "Seeing at the Nanoscale IV" to continue to be a premier international scientific forum for those involved in nanoscience from both academia and industry. Nanostructural imaging, characterization, and modification utilizing scanning probe microscopy is revolutionizing scientific research. This conference is a tremendous opportunity for scientists worldwide to discuss their latest discoveries."
Session topics for "Seeing at the Nanoscale IV" will be as follows: Session 1: Nanomechanical & Local Property Measurements/ Chair: Greg Meyers, Dow Chemical Company. Guest Speaker: Ozgur Sahin, Harvard University Session 2: Biomolecules and Biological Processes/ Chair: Jan Hoh, Johns Hopkins School of Medicine. Guest Speaker: Alexander Malkin, Lawrence Livermore National Labs Session 3: Visualization II: Materials and Polymer System/ Chair: Sergei Magonov, Veeco Instruments. Guest Speaker Dimitri Ivanov, Institut de Chimie des Surfaces et Interfaces, France Session 4: Measurements of Electrical, Optical, Magnetic and Thermal Properties of Materials at the Nanoscale/ Chair: Sergei Kalinin, Oak Ridge National Laboratory. Guest Speaker Louis Brus, Columbia University Session 5: Instrumentation: New Tools and Techniques for Nanoscience/ Chair: Ning Xi, Michigan State University. Guest Speaker Levent Degertekin, Georgia Tech
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide, data storage, HB-LED/wireless, semiconductor and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com