| Analytical TableTop Microscope TM3000 4 out of 5 Request info | 
It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
Read more | - Ease of use 4 out of 5
- After sales service 4 out of 5
- Value for money 4 out of 5
1 review(s) of this product / read all | | |
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| HD-2700 Cs Corrected STEM Request info | 
The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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| HF-3300 300 kV FE TEM Request info | 
The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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| Hitachi VP-SEM SU1510 Request info | 
Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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| IM4000 Ion Milling System Request info | 
The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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| NB5000 nanoDUE'T FIB-SEM Request info | 
The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.
Like all our products, all components have been designed with...
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| S-3400N Fully Automated VP SEM 5 out of 5 Request info | 
The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
Read more | - Ease of use 5 out of 5
- After sales service 4 out of 5
- Value for money 4 out of 5
2 review(s) of this product / read all | | |
| S-3700N Ultra Large VP-SEM Request info | 
The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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| SU3500 Premium VP-SEM Request info | 
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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| SU6600 Analytical VP FE-SEM 4 out of 5 Request info | 
The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
Read more | - Ease of use 4 out of 5
- After sales service 3 out of 5
- Value for money 4 out of 5
1 review(s) of this product / read all | | |
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| SU9000 UHR FE-SEM Request info | 
The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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