Electron Microscopy Accessories


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Detectors (6)

Other (5)


Sample Preparation (23)

Software (7)



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ATLAS  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for...
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ATLAS 3D  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS 3D is a package of hard- and software specifically designed for FIB nanotomography. You automatically create a 3D data stack at a...
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SmartSEM  
ZEISS Microscopy

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Use SmartSEM to fully control all operational parameters SmartSEM is your software solution for SEM, FE-SEM and FIB-SEM. Choose between different operating modes for the GUI depending...
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ZEMAS  
ZEISS Microscopy

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ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from...
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Avizo® Fire  
FEI Company

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3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
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Imaris Measurement Pro  
Bitplane AG (Part of the Andor Group)

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Because Your Image Is More Than A Pretty Picture Imaris MeasurementPro enables researchers to extract critical statistical parameters from their microscopy images thus allowing for the...
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QUANTAX Micro-XRF  
Bruker-Nano

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QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF...
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QUANTAX WDS  
Bruker-Nano

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QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM QUANTAX WDS features the compact XSense spectrometer. This high precision instrument incorporates...
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1020 Plasma Cleaner  

4 out of 5


E.A. Fischione Instrumental Inc.

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For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Automatic Twin-Jet Electropolisher  
E.A. Fischione Instrumental Inc.

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High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any...
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Model 1040 NanoMill® TEM specimen preparation system  
E.A. Fischione Instrumental Inc.

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Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens...
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Model 190 Cryo-Can for SEM  
E.A. Fischione Instrumental Inc.

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Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample...
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Model 2020 Advanced Tomography Holder  

4 out of 5


E.A. Fischione Instrumental Inc.

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Ideal for room temperature electron tomography High tilt in narrow gap pole pieces Optimized specimen retention Extended field of view Easy, accurate specimen...
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  • Ease of use 3 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Model 3000 Annular Dark Field Detector  
E.A. Fischione Instrumental Inc.

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High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows...
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PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

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The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
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QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

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QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Cross Section Polisher II  
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JIB-4000 High Throughput FIB  
JEOL USA

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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EM CPD300  

5 out of 5


Leica Microsystems

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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Ion Beam Slope Cutter Leica EM TIC 3X  
Leica Microsystems

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chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than...
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Leica EM AMW - Tissue Processor for Electron Microscopy  
Leica Microsystems

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With minimal user interface, rapidly process, embed, and polymerize specimens into resin with the Leica EM AMW’s unique, highly automated system. The patented combination of microwave...
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Leica EM FC7 - Cryochamber  
Leica Microsystems

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Change your Ultramicrotome Leica EM UC6 or Leica EM UC7 to a Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for...
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