Accurate Determination of Film Thickness by Fast-Scanning IR
24 Jan 2013

From special lenses and mirrors with a specific coating to semiconductor components with surface-doped substrates. All of these products need their respective surfaces measured for QC or R&D purposes, but are too thin for direct physical measurement and too difficult to measure with cross-sectional microscopy. This application note discusses the benefit of a scanning based system which provides the best quality data for this analysis and specifically demonstrates the capabilities of the Buck Scientific M500 Scanning IR System.

Download this Article




    Popular tags in SelectScience