In-Situ-Squared: Combined Electrical and Mechanical Testing of Flexible Electronic Materials with Confocal Laser Scanning Microscopy
18 Nov 2015

Learn new in-situ techniques to investigate the electrical and mechanical behavior of thin films and structures used in flexible electronic devices. The combination of mechanical straining, while acquiring electrical resistance and 3D images of the surfaces with confocal laser scanning microscopy, provides valuable data for reliability testing of flexible electronics.

Dr. Megan J. Cordill, Senior Scientist, Erich Schmid Institute of Materials Science; and Jakob Mallmann, Product and Application Specialist for Materials Science Microscopy, OLYMPUS EUROPA SE & CO. KG; will discuss:

  • Basics of fragmentation testing - in-situ and in-situ squared methods.
  • Tensile induced adhesion testing of metal-polymer interfaces.
  • In-situ squared fatigue testing of flexible electronic materials using confocal laser scanning microscopy.
  • Strategies in 2D and 3D characterization of micro scale surfaces.


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