The Bruker Nano Analytics (BNA) Division, headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro- and nano-scale.
BNA's product range comprises analytical tools for electron microscopes, including energy-dispersive X-ray spectrometers (EDS), electron backscatter diffraction systems (EBSD) and micro computed tomography (Micro-CT) accessories, as well as mobile and bench-top micro X-ray fluorescence (µ-XRF) and total reflection X-ray fluorescence (TXRF) spectrometers.
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QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis
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QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM
QUANTAX WDS features the compact XSense spectrometer. This ...
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Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resol...
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13 Sep 2013
Bruker Introduces Two New Analytical Accessories for Materials Characterization in Electron Microscopes
06 Aug 2013
03 May 2013
Imec Confirms Bruker’s New Dimension Icon® SSRM-HR Atomic Force Microscope Configuration Offers Highest Resolution Carrier Profiling Capability
22 Apr 2013
Bruker Introduces New Value Standard with Scalable Microscope for Combined Optical Surface Metrology and Imaging
05 Mar 2013