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attoMFM I  
Attocube Sytems, AG

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Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based The Attocube attoMFM I is a compact magnetic force microscope designed particularly for...
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CSC05 AFM Mode Contact Probe  
K-TEK Nanotechnology

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CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the...
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CSG01 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of...
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CSG10 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality...
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CSG11 AFM Mode Contact Probe  
K-TEK Nanotechnology

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K-TEK CSG11 AFM Mode Contact Probe This versatile CSG11 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality...
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CSG30 AFM-Mode Probes  
K-TEK Nanotechnology

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K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency...
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DCP11 Diamond Coated Probe  
K-TEK Nanotechnology

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K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user...
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DCP20 Diamond Coated Probe  
K-TEK Nanotechnology

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K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a...
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FMG01 AFM Mode Non-Contact Force Modulation Probe  
K-TEK Nanotechnology

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K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater...
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HA_NC Etalon AFM Mode Contact Probe  
K-TEK Nanotechnology

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HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano K-TEK Nanotechnolgy's dual cantilever Etalon probe features:   • High aspect ratio tip  • Precisely specified resonant...
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NSG01 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which...
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NSG01 DLC AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for...
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NSG03 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater...
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NSG10 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of...
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NSG20 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms...
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NSG30 AFM Mode Non-Contact Probe  
K-TEK Nanotechnology

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K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency...
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TETRA 14 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 15 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the...
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TETRA 16 Non-Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples...
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TETRA 17 Contact AFM Probe  
K-TEK Nanotechnology

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TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing...
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