Your FIB-SEMs for Nanotomography and Nanofabrication Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. Wit...read more
Your FIB-SEMs for Nanotomography and Nanofabrication
Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.
Gain More Information in Less Time • Speed up your nanotomography and nanofabrication: combine low kV SEM performance with FIB currents up to 100 nA. • Gain maximum information: use multi-detector acquisition and the ability to mill and image s imultaneously. •Examine large fields of view of up to 50 k x 40 k pixels - thanks to GEMINI technology and the optional ATLAS 3D package.
Keep Full Process Control • Profit from maximum stability and a uniform beam profile during your demanding long-term experiments. • Change system parameters such as probe current or acceleration voltage in real time during your acquisition, without image adjustments. • Enjoy the easy-to-understand graphical user interface.
Experience Maximum Flexibility • Easily upgrade your Crossbeam with a wide range of detectors and accessories. • Customize your system for in situ experiments. • With the open application programming interface (API) you have access to every microscope parameter.
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