Your FIB-SEMs for Nanotomography and NanofabricationSpeed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples. Highlights:Gain More Information in Less Time• Speed up your nanotomography and nanofabrication: combine low kV SEM performance with FIB currents up to 100 nA. • Gain maximum ...Read more
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