ZEISS Crossbeam 340 and Crossbeam 540

ZEISS Crossbeam 340 and Crossbeam 540
by ZEISS Microscopy


Your FIB-SEMs for Nanotomography and Nanofabrication Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use ...read more

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Description

 

Your FIB-SEMs for Nanotomography and Nanofabrication

Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.

With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.

Highlights:

Gain More Information in Less Time

• Speed up your nanotomography and nanofabrication: combine low kV SEM performance with FIB currents up to 100 nA.
• Gain maximum information: use multi-detector acquisition and the ability to mill and image s imultaneously.
•Examine large fields of view of up to 50 k x 40 k pixels - thanks to GEMINI technology and the optional ATLAS 3D package.

Keep Full Process Control
• Profit from maximum stability and a uniform beam profile during your demanding long-term experiments.
• Change system parameters such as probe current or acceleration voltage in real time during your acquisition, without image adjustments.
• Enjoy the easy-to-understand graphical user interface.

Experience Maximum Flexibility
• Easily upgrade your Crossbeam with a wide range of detectors and accessories.
• Customize your system for in situ experiments.
• With the open application programming interface (API) you have access to every microscope parameter.

Product Overview

ZEISS Crossbeam 340 and Crossbeam 540 by ZEISS Microscopy
ZEISS Crossbeam 340 and Crossbeam 540

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