ZEISS Crossbeam 340 and Crossbeam 540

Manufacturer ZEISS Microscopy  |  Available Worldwide
Your FIB-SEM for High Throughput Nanotomography and Nanofabrication.


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Speed up your tomography runs and use high FIB currents with excellent spot profiles to bridge the gap between micro- and nanopatterning.

Take full control of FIB processing and enjoy the benefits of live FE-SEM monitoring. Perform complex, leading-edge applications, thanks to Crossbeam’s modular platform concept, an open and easily extendable software architecture and unique solutions for demanding, charging or magnetic samples.

Combine the powerful imaging and analytical performance of the GEMINI column with the superior processing ability of a next-generation FIB to form a complete 3D nano-workstation.

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ZEISS Crossbeam 340 and Crossbeam 540

Manufacturer ZEISS Microscopy  |  Available Worldwide

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