XRD-6100 – General-purpose X-Ray Diffractometer
The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6100 offers solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state change analysis, including stress analysis, residual austenite quantitation, crystallite size/lattice strain, & crystallinity calculation.
XRD-7000 – New Concept in Multifunctional X-Ray Diffractometry
A theta/theta configuration with options to accommodate samples up to 400mm in diameter, the XRD-7000 is able to handle extra-large samples as well as liquid samples. In addition to basic qualitative and quantitative analysis, the XRD-7000 handles residual austenite quantitation, environmental quantitative analysis, degree of crystallinity calculations, and crystal system determination, among others, while a range of attachments expands the application capabilities.
XRD-6100/7000 X-ray Diffractometers Features:
- High-precision, Vertical Goniometer - Enabling analysis of samples in various states, each instrument´s goniometer features a high-speed rate (1000°/min) and high-precision angle reproducibility (±0.001° for the XRD-6100 and ±0.0002° for the XRD-7000) for fast measurement and highly reliable data.
- Safe, Easy-to-Operate Design - With a front door mounted on guide rollers, installation/exchange of samples and attachments is easy while a door lock mechanism provides a safe operating environment during operation.
The XRD-6100 minimizes space requirements with a size of just 900 mm (w) x 700 mm (d) x 1600 mm (h).
- X-Ray Tubes - The XRD-6100/7000 accept various types of X-ray tubes, including the normal focus 2kW type and broad focus 2.7kW type, as well as the optional long line focus 2.2kW type.
- High Stability X-Ray Generator - Tube voltage and tube current are stable to/within ±0.01%, and this stability is unaffected during fluctuation of source voltage or ambient temperature.