Ultra-high Resolution Scanning Electron Microscope S-5500

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development.

The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design.
The S-5500 permits 3-dimensional morphological observation down to the atomic or molecular structures of various materials, far surpassing the performance of any conventional SEM.

A New BF/DF DUO-STEM Detector (Patent Pending) with variable collection angle adds a flexibility in signal capturing for imaging capability that gives the researcher a new dimension is signal control.