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Unprecedented quantitative characterization of materials on the nanoscale

PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which records very fast force response curves at every pixel in the image. The force control made possible by this technique leads to longer probe lifetimes and improved sample integrity, as well as correlated, high-resolution nanomechanical and topographic data.

These capabilities dramatically exceed those of any other technique for nanoscale materials characterization, changing the perception and use of AFM.