NSG03 AFM Mode Non-Contact Probe
K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory. Available Options with the K-TEK NSG03 AFM Mode Non Contact Pr…
The supplier does not provide quotations for this product through SelectScience. You can search for similar products in our Product Directory.
K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe
This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory.
Available Options with the K-TEK NSG03 AFM Mode Non Contact Probe:
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
-Bare
-Tipless*
*Quantity & cantilever restrictions apply.
NSG03 AFM Cantilever Specification
Resonant frequency kHz: min 47, typical 90, max 150
Force constant N/m: min 0.35, typical 1.74, max 6.1
