K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe
This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the NSG01AFM-mode non-contact probe:
• PtIr, TiN, and Au tip coatings
• CoCr magnetic tip coating*
*Quantity & cantilever restrictions apply.