NSG01 AFM Mode Non-Contact Probe

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K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact Probe

This versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.

Available Options with the NSG01AFM-mode non-contact probe:

• PtIr, TiN, and Au tip coatings
• CoCr magnetic tip coating*
• Bare
• Tipless*

*Quantity & cantilever restrictions apply.

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