NanoWizard II

NanoWizard II
 3.7/5.0 (1 review)

JPK Instruments

New standards for soft matter and life science AFM Most stable platform for highest resolution in imaging and force measurements Stand-alone tip scanning design for flexibility in the ap...read more

Request Pricing





Receive your quote directly from JPK Instruments for NanoWizard II

JPK Instruments

Reviews

Marta Larraona-puy


Status:


See all reviews
Member since 2012

Job Title:
Research Scientist / Senior / PI
Discipline:
Materials testing
Work Field:
Academia / University
Organization:
Stockholm University
Read more »
RATING: 3.7

  • 2 out of 5EASE OF USE
  • 5 out of 5AFTER SALES SERVICE
  • 4 out of 5VALUE FOR MONEY




Review date: 30 Oct 2012

Application Area: Thin lipid films
NanoWizard II

"The microscope objective wheel is a problem. You are not able to use different microscope objectives with the sample. However, the rest is OK and it is easier than silicon to approach. But I do find it annoying to load the tips with the spring system."

Description

 

  • New standards for soft matter and life science AFM
  • Most stable platform for highest resolution in imaging and force measurements
  • Stand-alone tip scanning design for flexibility in the applications
  • Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon
  • Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
  • Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
  • In-situ imaging in biological/chemical fluids or in air
  • Measurements at variable temperatures with perfusion possibilities
  • Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors

SelectScience Trusted Banner
Why make an inquiry with SelectScience?

Advertisement