- Ease of use
- After sales service
- Value for money
Description
- New standards for soft matter and life science AFM
- Most stable platform for highest resolution in imaging and force measurements
- Stand-alone tip scanning design for flexibility in the applications
- Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon
- Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
- Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
- In-situ imaging in biological/chemical fluids or in air
- Measurements at variable temperatures with perfusion possibilities
- Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors
Application notes and news
- JPK Reports on Single Molecule Research at IISER Pune in India using AFM and CellHesion Techniques
- JPK Reports on the Applied Research of Ioan Notingher at the University of Nottingham using AFM and the Tip...
- Pushing the Boundaries of AFM with JPK’s NanoWizard - The First Images of DNAs Double Helix In the Molecule...
Reviews
Marta Larraona-puy Status: See all reviews Member since 2012 Job Title: Research Scientist / Senior / PI Discipline: Materials testing Work Field: Academia / University Organization: Stockholm University Read more » | RATING: 3.7 
"The microscope objective wheel is a problem. You are not able to use different microscope objectives with the sample. However, the rest is OK and it is easier than silicon to approach. But I do find it annoying to load the tips with the spring system."   |
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