ZEISS LSM 700 for Materials

Manufacturer ZEISS Microscopy

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Non-tactile measurement of 3D-topography

Count on LSM 700 for many different materials research applications, such as metal and non-metal surfaces, transparent materials, synthetic and organic polymers. Measure topography, waviness, roughness and layer thickness of your samples. This confocal laser scanning microscope operates quickly and accurately without tactile contact.

LSM 700 from Carl Zeiss simplifies materials research with its fully automated hardware and high scanning speeds. The focus linear sensor measures the exact z-position automatically.

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