JSM-7100F Scanning Electron Microscope

by JEOL USA

4.7/5.0 (1 reviews)

Product Image
JSM-7100F Scanning Electron Microscope
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The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully eucentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage, and expandability with ideal geometry for EDS, WDS, EBSP, and CL. The specimen chamber handles specimens up to 200mm in diameter. A new Windows® XP based computer interface allows for unprecedented ease of operation including function buttons that switch operation modes quickly and easily. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once. The JSM-...Read more

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Average Rating: 4.7

Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
Rating: 4.7
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
5 out of 5
  • Review date: 30 Oct 2012

  • Application Area: Paints

  • JSM-7100F Scanning Electron Microscope

"Very good service, I was well informed about the instrument through demonstrations which made it easier to choose the appropriate instrument. I have found the instrument simple to use and the software is very user friendly. I would recommend this instrument to a colleague."

Description

The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully eucentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage, and expandability with ideal geometry for EDS, WDS, EBSP, and CL. The specimen chamber handles specimens up to 200mm in diameter.

A new Windows® XP based computer interface allows for unprecedented ease of operation including function buttons that switch operation modes quickly and easily. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once.

The JSM-7100F SEM also supports full integration of EDS, WDS, e-beam lithography, and an image database. Stage automation is standard with a 5-axis computer control of X, Y, Z Tilt and eucentric rotation.

Low Vacuum Operation

The JSM-7001FLV offers all the high resolution performance of a field emission SEM with the ability to image non conductive samples at moderate to high kV and higher beam current. EDS, backscatter imaging, EBSD and other analytical techniques can be performed without the need to coat the sample with metal or carbon for conductivity. This is especially useful for applications where: the sample can not be altered, further testing is to be done, or the sample is to be placed back into the production line.

Product Overview

Product Image

JSM-7100F Scanning Electron Microscope

by JEOL USA

4.7/5.0 (1 reviews)
Ease of use
4 out of 5
After sales service
5 out of 5
Value for money
5 out of 5






Receive your quote directly from JEOL USA for JSM-7100F Scanning Electron Microscope