With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, chara...read more
Organization: MERCURY CENTRE - UNIVERSITY OF SHEFFIELD Read more »
5 out of 5EASE OF USE
4 out of 5AFTER SALES SERVICE
4 out of 5VALUE FOR MONEY
Review date: 05 Nov 2012
Application Area: Materials science Inspect™ - Scanning Electron Microscope
"Very easy to use interface that makes analysis time shorter than with other equipment. Good resolution at SkeV for fine grain size microstructures. Large entry chamber gives flexibility for wide range of sample sizes."
With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models’ high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.
Write a review
Sharing your experience will help scientists like you. Achieve Reviewer Status and Win an iPad air (All reviews published will be entered into the next drawing on May 30th 2014).
Why make an enquiry with SelectScience?
EASY It’s quick and simple to do
FAST Your enquiry will be delivered straight to the manufacturer
FREE You’re under no obligation
SECURE We only pass your details on to trusted suppliers at your request
SAVE TIME Submit your details once and make multiple enquiries