Innova Scaning Probe Microscope by VEECO Instruments Inc.

Innova Scaning Probe Microscope by VEECO Instruments Inc. product image
Innova Scaning Probe Microscope
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VEECO Instruments Inc.

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Lowest noise, highest resolution Atomic Force Microscope in its class

The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.

The Integrated AFM-Raman Imaging System (IRIS) Module for Veeco Atomic Force Microscopes enables the seamless blend of AFM and Raman spectroscopy by combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with the most advanced nanoscale mechanical, electrical, and thermal AFM characterization. The IRIS Module supports both the Innova and BioScope™ Catalyst™ AFM Systems, providing combined-technique experiment control for advanced research in both materials and life sciences applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon. However you tailor your system, your application will benefit from the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.