Lowest noise, highest resolution Atomic Force Microscope in its classThe Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns. The Integrated AFM-Raman Imaging System (IRIS) Module for Veeco Atomic Force Microscopes enables the seamless blend of AFM and Raman spectroscopy by combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with the most advanced nanoscale mechanical, electrical, and thermal AFM characterization. The IRIS Module supports both...Read more
VEECO Instruments Inc.
Receive your quote directly from VEECO Instruments Inc. for Innova Scaning Probe Microscope