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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing.

The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine positioning via the use of an external high-resolution optical microscope.