Bruker’s microplate extension HTS-XT allows the application of FT-IR spectroscopy as method for high-throughput screening.
This external module can be connected to different Bruker Optics FT-IR spectrometers. Depending on its configuration it can be used for measurements in the mid infrared to the near infrared and even the VIS range.
The sampling plates for the IR analysis correspond to the standardized 96- or 384-well microplate formats. Acquisition, control and evaluation of spectral data from large numbers of samples are performed fully automated by the integrated OPUS/LAB software.