HA_NC Etalon AFM Mode Contact Probe
HA_NC Etalon AFM Mode Contact Probe from K-TEK NanoK-TEK Nanotechnolgy's dual cantilever Etalon probe features: • High aspect ratio tip • Precisely specified resonant frequency • Enhanced reflection • Economic price Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: • Standard chip size: 1.6x3.6x0.45 mm. • High reflective Au coating. • Typical curvature radius of a tip: 10 nm. • Total tip height : 9 - 16 µm. •…
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HA_NC Etalon AFM Mode Contact Probe from K-TEK Nano
K-TEK Nanotechnolgy's dual cantilever Etalon probe features:
• High aspect ratio tip
• Precisely specified resonant frequency
• Enhanced reflection
• Economic price
Main characteristics of the HA_NC Etalon AFM Mode Contact Probe:
• Standard chip size: 1.6x3.6x0.45 mm.
• High reflective Au coating.
• Typical curvature radius of a tip: 10 nm.
• Total tip height : 9 - 16 µm.
• Each chip has two RECTANGULAR springs.
• Recommended for noncontact/semicontact modes.
• Packaged in GelPak® boxes.
