Product News: JEOL to Present Latest Analysis and Imaging Capabilities at Pittcon 2013

13 Mar 2013

JEOL's latest mass spec instrumentation, NMR technology, and analytical scanning electron microscopes (SEM) will be on display at Pittcon 2013 in Philadelphia, PA, March 18-21 in booth 2224. The new AccuTOF GCv 4G mass spectrometer, the NeoScope Benchtop Scanning Electron Microscope (SEM) and the InTouchScope SEM will be in the booth #2224. Technical experts will be in the booth and also presenting during two key events.

JEOL will hold a press conference on Monday, March 18th from 10:30-11, Room #103C. The half-hour discussion features speakers Dr. Chip Cody and Mr. David Edwards of JEOL USA. Topics include:

• Introduction of the new AccuTOF GCV 4G time-of-flight mass spectrometer. For the first time, this instrument will be shown in the U.S. and will be paired with the Zoex GCxGC interface used with JEOL’s unique EI/FI ion source. The AccuTOF GCV 4G is the only high-resolution mass spectrometer that combines comprehensive gas chromatography with high-resolution mass spectrometry and a choice of EI, CI and FI ion sources. The JEOL combination EI/FI source offers a powerful and routine alternative to chemical ionization for a wide range of applications.

• Introduction of the new capabilities of the SpiralTOF MALDI-TOF-TOF mass spectrometer, including MALDI imaging and LC/MALDI-MS, including correlative microscopy between the SpiralTOF and JEOL's SEM product line. The SpiralTOF's 17-meter flight path minimizes the effect of topographic variations on samples, such as biological tissues and fingerprints, and maintains high mass-resolving power.

• Open air analysis is no longer a novelty – it has become a must-have technology for mass spectrometry in a multitude of fields. JEOL continues to lead in developing new DART methods and applications for its AccuTOF-DART system.

• The newly redesigned NeoScope benchtop SEM features integrated Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology for advanced analytical applications. The NeoScope offers selectable accelerating voltages and up to 60,000X magnification - all in a simple-to-use, benchtop instrument.

Additionally, JEOL will participate in the Japan Symposium on March 19, Room 122B, from 2:40-3:15 with a presentation by Dr. Thomas Isabell entitled "Aberration Corrected Electron Microscopy: Structure Determination and Chemistry on the Atomic Scale."

Additional talks and poster sessions:

Monday, room 118A: 9:35 (450-5) DART-MS Collision Induced Dissociation (CID) for Structural Analysis of Synthetic Cannabinoids JASON SHEPARD, University at Albany, SUNY, Rabi Musah, Ashton Lesiak, Marek Domin, Robert B Cody, John Dane.

Tuesday, room 1118C: 8:40 (1060-3) The State-of-the-DART for Forensic Analysis ROBERT B CODY, JEOL USA, Inc.

Tuesday, room 118C 3:15 (1320-3) Five Years of DART-TOF Forensic Applications ROBERT R STEINER, Virginia Dept of Forensic Science.

Tuesday, room 122B, 2:40 (1280-2) Aberration Corrected Electron Microscopy: Structure Determination and Chemistry on the Atomic Scale - THOMAS C ISABELL, JEOL USA, Inc.

Tuesday, poster (890-8 P) Rapid Non-Destructive Identification of Magnetic Tape Degradation Products.

Using Infrared Spectroscopy and DART Mass Spectrometry with Multivariate Statistics - BRIANNA CASSIDY, University of South Carolina, Zhenyu Lu, Stephen Morgan, Eric Breitung, Juan Rodriguez, Samantha Skelton.

Zoex GCxGC talk:
Monday 9:55 (490-2) GCxGC Separation of Fatty Acid Methyl-Esters: Using Giddings Dimensionality to Aid the Interpretation of Comprehensive Two-Dimensional Gas Chromatograms - EDWARD B LEDFORD, Zoex Corporation, William Spear, Zhanpin Wu, Pierluigi Delmonte, Ali Reza Fardin-Kia, Jeanne I Rader.

Picture caption: The JCM-6000 NeoScope™