Glow Discharge Spectrometry Offers Sputtering Times 10 to 100 Times Faster

6 May 2013

HORIBA Scientific (HORIBA), global leader in Glow Discharge Optical Emission Spectrometry (GDOES), announces a new patented process for fast sputtering of polymers and polymeric containing layers by glow discharge spectrometry.

In Glow Discharge, the material of interest is sputtered using pulsed Radio Frequency plasma; the sputtered species are excited by the same plasma and simultaneously measured in real time with a spectrometer providing elemental composition depth profiles.

The analytical benefits of the new development, first presented in 2012 at HORIBA’s international GD Day, include not only a gain in speed, but also a parallel gain in sensitivity. It also offers fast access to embedded interfaces located below a thick organic layer.

Applications range from automotive organic layers to encapsulated PV cells, and even DVDs. In the last example, nanometer depth resolution was demonstrated below a top layer of 70 microns thickness.

The GD-Profiler 2™ for Elemental Analysis

HORIBA Scientific

The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterisation and process studies. Equipped with an RF source that can operate in pulse mode for fragile samples, the range of applications of the GD-Profiler 2™ goes from corrosion studies to PVD coating process control and it is used in universities as well as in routine metal and alloys production plants.

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Glow Discharge Spectrometry Offers Sputtering Times 10 to 100 Times Faster