Agilent Technologies Introduces Surface Imaging and Analysis Software to Enhance Atomic Force Microscope Utility

28 Nov 2007
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Agilent Technologies Inc. today introduced Pico Image, a modular atomic force microscope (AFM) imaging and analysis software package designed for AFM users working in a wide range of research applications, including life sciences and material sciences. Pico Image analyses image data and generates dynamic, highly detailed surface analysis reports with unprecedented power and ease.

“Pico Image has now been integrated into the PicoView software platform for our complete line of AFMs, including the 5400 and 5500,” said Jeff Jones, operations manager for Agilent’s AFM facility in Chandler, Ariz. “Pico Image allows our customers to easily visualise and analyse the structures and properties of their samples.”

Each Pico Image analysis document consists of a set of frames containing surfaces, profiles extracted from surfaces, the results of applying filters and other operators, analytical studies, and 2-D and 3-D parameters that conform to international standards. Real-time 3-D imaging provides excellent visualization. Videos of flight paths over a surface can also be integrated into Pico Image presentations. The software’s intuitive desktop publishing interface, comprehensive online help, and multi-language support enhance ease of use.

Pico Image contains three performance levels, offering feature sets that meet the needs of basic, advanced and expert users, respectively. Sophisticated functions include the ability to convert a surface into a series of profiles, compute the similarity of different surfaces, generate sub-surfaces and perform fractal analysis. Particle analysis and statistics options are also offered. Standalone and network licenses are available.

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