Product News: All-New Benchtop SEM Features EDS Analysis and 60,000X Imaging

24 Mar 2013

JEOL will demonstrate the all-new NeoScope Scanning Electron Microscope at Pittcon 2013, March 18-21, Philadelphia, PA. NeoScope combines 10x-60,000X high magnification imaging and comprehensive elemental analysis in a compact, lightweight benchtop SEM. A completely new design this year, NeoScope offers full-featured Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology for advanced analytical applications.

The NeoScope makes it simple for any skill level of operator to obtain outstanding SEM images in less than three minutes from sample loading to imaging. This benchtop SEM features multi-touch screen operation, automated operating parameters, selectable low and high vacuum, and three selectable accelerating voltages.

The NeoScope accelerates the pace of research in the life sciences, forensics, and pharmaceutical fields, and serves as a high throughput failure analysis tool.

Ideal for QC and fast, easy analysis and imaging, the NeoScope incorporates JEOL technology leadership and is represented in the U.S. by Nikon Instruments.