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ContourGT-K 3D Optical Microscope  

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Uncompromised Imaging and Metrology for Widest Range of Surfaces Combining exceptional profiling performance, operator convenience, and affordability into one bench top instrument. The...
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Dimension Edge™ AFM platform  

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Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's...
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Dimension FastScan™  

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World's Ultimate AFM The new benchmark for speed with highest resolution and performance The Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of...
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Dimension Icon Atomic Force Microscope  

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