Single Particle Analysis of Nanomaterials Using the Agilent 7900 ICP-MS
13 May 2014

This application note evaluates the performance of the Agilent 7900 ICP-MS for the measurement of individual NP peak signals. The 7900 ICP-MS features a new orthogonal detector system that has a fast integration time of 100 μs, zero settling time between TRA readings, and an overall acquisition speed in TRA mode that is 30x faster than the 7700x, permitting fast transient signal measurement.

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