Secondary Ion (SIMS)



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SelexION™ Technology  

5 out of 5


AB SCIEX

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The AB SCIEX SelexION™ Technology device is an effective ion mobility spectrometry tool for improving data quality in the quantitation and characterization of challenging samples...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all
PHI TRIFT V nanoTOF  
Physical Electronics

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PHI nanoTOF TOF-SIMS The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented...
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