In Situ & 4D Science: Observing and Quantifying the Evolution of 3D Microstructure
17 Dec 2014

A new materials science has emerged in which samples are analyzed “in situ” to facilitate essential characterization of performance under relevant operating or environmental conditions. This technical note demonstrates how the ZEISS 3D X-ray microscopes (XRM) are uniquely suited to image materials in situ under variable environments in 4D (3D plus time) in order to non-destructively characterize and quantify the evolution of 3D microstructures.

Show    per page
1 of 2     Page  1 2 Next 
Investigations of Pharmaceutical Drug Delivery Systems with Topographic Confocal Raman Imaging drug delivery, biopharmaceutical analysis, raman24 Nov 2014Read
Are Your Digital Microscope Measurements Accurate and Reliable? digital microscopy28 Oct 2014Read
Spectral Characteristics of an Integrated Type-I Parametric Down-Conversion Source10 Oct 2014Read
Instrumentation for Conventional Raman Microscopy and Total Internal Reflection Raman Microscopy raman10 Oct 2014Read
Three-Dimensional Plasmonic Nanoclusters CCD camera9 Oct 2014Read
Topography and Refractive Index Measurement of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy thin films, spectral scanning7 Oct 2014Read
History in a New Light – the Role of Light Microscopy in Cultural Heritage microscopy23 Sep 2014Read
Raman and Photoluminescence Measurements on Laser Lithographically Written Structures in Silicon semiconductors, silicon19 Sep 2014Read
Colliding Plasmas and Stagnation Layers - A Potential Platform for Analytical Techniques18 Sep 2014Read
Control of External Devices during Time Series Acquisition with ZEISS Lightsheet Z.1 fluorescence microscopy, microscopy8 Sep 2014Read

Popular tags in SelectScience